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2017

2017.3.14-16: GAIO will attend 'Embedded World 2017' in Nuremberg, Germany

GAIO will attend the exhibition show 'Embedded World 2017' in Nuremberg, Germany.
Please visit our booth at Hall 4/ 4-408 and experience the best-class solution for the embedded market. We will exhibit MBD back-to-Back test tool 'MC-Verifier', embedded software unit testing tool 'CoverageMaster winAMS', and ISO26262 safety concept design tool 'Safilia'.

GAIO will also have a presentation at Exhibitors` Forum.
13:00-13:30 on 3/15 at 4-422, Hall4.

GAIO will present how our tools perform and will show their value in the perspective of the automotive industry that demands high-reliability and high-efficiency testing.

More Info.

2016

2016.2.23-25 : Embedded World 2016 in Nuremberg, Germany

GAIO attended the exhibition show 'Embedded World 2016' held at Fachmesse in Nuremberg, Germany, Feb. 23rd 2016. More Info.

2015

2015.11.218 : GAIO attended Embedded Technology 2015 JAPAN

GAIO attended Embedded Technology 2015 held at Pacifico Yokohama as an exhibitor. We displayed software test tools and engineering services. More Info(Japanese)

2015.2.24-26 : Embedded World 2015 in Nuremberg, Germany

GAIO attended the exhibition show 'Embedded World 2015' held at Fachmesse in Nuremberg, Germany, Feb. 24th 2015. More Info.

2014

2014.8.19 : GAIO's office will be relocated to a new office effective September 1 2014.

In order to support our rapid growth and business expansion, we are pleased to inform you that our office will be relocated to a new office. Notice of Office Relocation

2014.5.14-16 : ESEC 2014 held in Tokyo has finished. Thank you for coming to GAIO booth.

GAIO attended the exhibition show 'ESEC 2014' held in Tokyo. More Info(Japanese)

2014.2.25 : Embedded World 2014 in Nuremberg, Germany

GAIO attended the exhibition show 'Embedded World 2014' held at Fachmesse in Nuremberg, Germany. More Info

2013

2013.11.20 : GAIO attended Embedded Technology 2013 JAPAN

GAIO attended Embedded Technology 2013 held at Pacifico Yokohama as an exhibitor. We displayed software test tools and engineering services. More Info(Japanese)

2013.11.18 : GAIO has concluded a distribution partnership with Embedded Tools GmbH in Germany.

GAIO has concluded a distribution partnership with Embedded Tools GmbH in Germany. They have started to operate the distribution of GAIO's tools in Germany, Austria and Switzerland domains.
More Info (electroniknet.de, German) GAIO Product Introduction (Embedded Tools GmbH, German)

2013.9.17 : GAIO attended SAE 2013 Symposium

GAIO attended 'SAE 2013 Electronic Systems for Vehicle Propulsion and Intelligent Vehicle Systems Symposium' as an exhibitor. We displayed MBD test tools and solutions. More Info

2013.7.5 : GAIO's tools have been re-certified as ISO26262/IEC61508 compilant tools

CoverageMaster and CasePlayer2 new version that include the function/call coverage testing feature have been re-certified as ISO26262/IEC61508 compliant test tools by TUV SUD. More Info

2012.2.26-28 : Embedded World 2013 in Nuremberg, Germany

GAIO attended the exhibition show 'Embedded World 2013' held at Fachmesse in Nuremberg, Germany. We displayed the embedded software unit testing tool 'CoverageMaster winAMS', the MBD Back-to-Back test tool 'MC-Checker' and the solutions for the automotive functional safety, ISO26262. More Info


2012


2012.11.14-16 : Embedded Technology 2012 at Pacifico Yokohama, JAPAN

GAIO attended the exhibition show 'Embedded Technology 2012' held at Pacifico Yokohama. We displayed the embedded software unit testing tool 'CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262. More Info (Japanese)


2012.7.5 : GAIO obtained tool certification for automotive functional safety ISO 26262

CoverageMaster winAMS/General and CasePlayer2 have been certified by TUV SUD Germany as tools that meet ISO 26262 standard. GAIO is the first company to obtain the tool certification in the Asia-Pacific region. More Info

2012.6.19-21 : Embedded China 2012 in Shanghai

GAIO attended the exhibition show 'Embedded China 2012' held at Shanghai World Expo Exhibition and Convention Center. We displayed the embedded software unit testing tool 'CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262. More Info

2012.2.28 : Embedded World 2012 in Nuremberg, Germany : GAIO Booth No.4-426, Hall 4

GAIO attended the exhibition show 'Embedded World 2012' held at Fachmesse in Nuremberg, Germany. We displayed the embedded software unit testing tool 'CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262.More Info

2011

2011.6.1 : Private Seminar : GAIO MBD/MDD Solution Seminar

A private seminar was held at the Tokyo International Forum on the topic of MBD/MDD solution and GAIO's new business named 'MCD' (Model Centered Development), where Dr. Seiichi Shin, an authority on control engineering, was invited as a lecturer. See Photos(Japanese)

2011.5.11-13 : Embedded Systems Expo - ESEC2011

GAIO attended the exhibition show 'Embedded Systems Expo 2011' held at Tokyo Big Sight. See Photos(Japanese)

2010

2010.12.1-3 : Embedded Technology 2009 - ET2010

GAIO will attend the exhibition show 'Embedded Technology 2010' held at Pacifico Yokohama. More Info. (Japanese)

2010.5.12-14 : Embedded Systems Expo - ESEC2010

GAIO attended the exhibition show 'Embedded Systems Expo 2010' held at Tokyo Big Sight. See Photos(Japanese)

2009

2009.5.13-15 : Embedded Systems Expo - ESEC2009

GAIO attended the exhibition show 'Embedded Systems Expo 2009' held at Tokyo Big Sight. See Photos(Japanese)

2008

2008.11.19 : Embedded Technology 2008 - ET2008

GAIO attended the exhibition show 'Embedded Technology 2008' held at Pacifico Yokohama. See Photos(Japanese)

2008.5.14 : Embedded System Expo - ESEC2008

This year the GAIO booth featured a demonstration counter, where presentations about our products and services were made to customers on an individual basis. See photos (Japanese)

2008.4.23 : Private Seminar : Third-party Unit Testing Service

A private seminar was held at the Tokyo International Forum on the topic of third-party unit testing, where Dr. Tetsuro Katayama, an authority on software testing, was invited as a lecturer. See Photos(Japanese)

2007

2007.11.30 : Private Seminar : Unit Testing Case Examples

A private seminar on the topic of embedded software unit testing was held at the Tokyo International Forum. Sony LSI designer Mr. Shinichi Hirota was invited as a lecturer for the event. See Photos(Japanese)

2007.11.28 : MATLAB EXPO 2007

GAIO attented the MATLAB EXPO 2007 in TOKYO as an exhibitor. See Photos(Japanese)

2007.11.2 : JaSST '07 in Kyushu

GAIO participated as an exhibitor at JaSST'07 in Kyushu.

2007.11.1 : JMAAB Open Conference

GAIO attended the JMAAB Open Conference as an exhibitor. See Photos(Japanese)

2007.10.16 : GAIO Becomes a Member of AUTOSAR

GAIO has become an associate member of AUTOSAR (AUTomotive Open System ARchitecture), an open and standardized automotive software architecture jointly developed by automobile manufacturers, suppliers and tool developers. AUTOSAR WEB Page

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