2013
2012.2.26-28 : Embedded World 2013 in Nuremberg, Germany
GAIO attended the exhibition show 'Embedded World 2013' held at Fachmesse in Nuremberg, Germany. We displayed the embedded software unit testing tool '
CoverageMaster winAMS', the MBD Back-to-Back test tool 'MC-Checker' and the solutions for the automotive functional safety, ISO26262.
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2012
2012.11.14-16 : Embedded Technology 2012 at Pacifico Yokohama, JAPAN
GAIO attended the exhibition show 'Embedded Technology 2012' held at Pacifico Yokohama. We displayed the embedded software unit testing tool 'CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262.
More Info (Japanese)
2012.7.5 : GAIO obtained tool certification for automotive functional safety ISO 26262
CoverageMaster winAMS/General and CasePlayer2 have been certified by TUV SUD Germany as tools that meet ISO 26262 standard. GAIO is the first company to obtain the tool certification in the Asia-Pacific region.
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2012.6.19-21 : Embedded China 2012 in Shanghai
GAIO attended the exhibition show 'Embedded China 2012' held at Shanghai World Expo Exhibition and Convention Center. We displayed the embedded software unit testing tool '
CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262.
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2012.2.28 : Embedded World 2012 in Nuremberg, Germany : GAIO Booth No.4-426, Hall 4
GAIO attended the exhibition show 'Embedded World 2012' held at Fachmesse in Nuremberg, Germany. We displayed the embedded software unit testing tool '
CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262.
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2011
2011.6.1 : Private Seminar : GAIO MBD/MDD Solution Seminar
A private seminar was held at the Tokyo International Forum on the topic of MBD/MDD solution and GAIO's new business named 'MCD' (Model Centered Development), where Dr. Seiichi Shin, an authority on control engineering, was invited as a lecturer.
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2011.5.11-13 : Embedded Systems Expo - ESEC2011
GAIO attended the exhibition show 'Embedded Systems Expo 2011' held at Tokyo Big Sight.
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2010
2010.12.1-3 : Embedded Technology 2009 - ET2010
GAIO will attend the exhibition show 'Embedded Technology 2010' held at Pacifico Yokohama.
More Info. (Japanese)
2010.5.12-14 : Embedded Systems Expo - ESEC2010
GAIO attended the exhibition show 'Embedded Systems Expo 2010' held at Tokyo Big Sight.
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2009
2009.5.13-15 : Embedded Systems Expo - ESEC2009
GAIO attended the exhibition show 'Embedded Systems Expo 2009' held at Tokyo Big Sight.
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2008
2008.11.19 : Embedded Technology 2008 - ET2008
GAIO attended the exhibition show 'Embedded Technology 2008' held at Pacifico Yokohama.
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2008.5.14 : Embedded System Expo - ESEC2008
This year the GAIO booth featured a demonstration counter, where presentations about our products and services were made to customers on an individual basis.
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2008.4.23 : Private Seminar : Third-party Unit Testing Service
A private seminar was held at the Tokyo International Forum on the topic of third-party unit testing, where Dr. Tetsuro Katayama, an authority on software testing, was invited as a lecturer.
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2007
2007.11.30 : Private Seminar : Unit Testing Case Examples
A private seminar on the topic of embedded software unit testing was held at the Tokyo International Forum. Sony LSI designer Mr. Shinichi Hirota was invited as a lecturer for the event.
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2007.11.28 : MATLAB EXPO 2007
GAIO attented the MATLAB EXPO 2007 in TOKYO as an exhibitor.
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2007.11.2 : JaSST '07 in Kyushu
GAIO participated as an exhibitor at JaSST'07 in Kyushu.
2007.11.1 : JMAAB Open Conference
GAIO attended the JMAAB Open Conference as an exhibitor.
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2007.10.16 : GAIO Becomes a Member of AUTOSAR
GAIO has become an associate member of AUTOSAR (AUTomotive Open System ARchitecture), an open and standardized automotive software architecture jointly developed by automobile manufacturers, suppliers and tool developers.
AUTOSAR WEB Page