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Global tool Interlink Solution (GIS)

Global tool Interlink Solution (GIS) is GAIO's new comprehensive development and verification solution designed for embedded system developers. Through GIS, GAIO's original tools and services may be linked with other company's tools in order to create custom tool chains to meet the needs of embedded system developers.

Life Cycle Management

Seminar Service

Automated Target Testing Solution

Virtual Verification Tool

Fault Injection Simulator

Interrupt Coverage Tool

Coverage Measurement Unit Testing Tool

Model/Code Back-o-Back Test Tool

Unit Test On the Track

Unit Testing Service

Program Analysis Tool

MISRA-C Rule Checker

Cross Compiler / IDE

WXG Functional Safety Solution

Software Unit Quality Diagnositc

Embedded Software Analysis Service

Reverse Modeling Service

Modeling for Test

Test Design Support

Math Model

Formal Method

HMI Design Tool

EAST-ADL/AADL Tool Chain

Modelica Tool Chain

UML/SysML Tool Chain

AUTOSAR Associate Member

Model Base Development

Functional Safety Solution ISO26262 IEC61508

Flowchart Program Chart Generation

Model Centered Development (MCD) Services

GAIO provides comprehensive MBD (Model Base Development) and MDD (Model Driven Development) solutions based on our embedded development tool and service experience. GAIO offers development services and consultation we call MCD, Model Centered Development services.


Latest News

2012.2.26-28 : Embedded World 2013 in Nuremberg, Germany

GAIO attended the exhibition show 'Embedded World 2013' held at Fachmesse in Nuremberg, Germany. We displayed the embedded software unit testing tool 'CoverageMaster winAMS', the MBD Back-to-Back test tool 'MC-Checker' and the solutions for the automotive functional safety, ISO26262. More Info

2012.11.14-16 : Embedded Technology 2012 at Pacifico Yokohama, JAPAN

 GAIO attended the exhibition show 'Embedded Technology 2012' held at Pacifico Yokohama. We displayed the embedded software unit testing tool 'CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262.
More Info (Japanese)

2012.9.1 : GAIO becomes an authorized dealer of HighTec's TriCore/Power Architecture compilers

 GAIO becomes an authorized dealer of HighTec's TriCore/Power Architecture compilers in the Japanese market domain.
Product Information (Japanese) : TriCore / Power Architecture

2012.7.5 : GAIO obtained tool certification for automotive functional safety ISO 26262

CoverageMaster winAMS/General and CasePlayer2 have been certified by TUV SUD Germany as tools that meet ISO 26262 standard. GAIO is the first company to obtain the tool certification in the Asia-Pacific region.
More Info

2012.6.29 : GAIO concludes large-scale usage-based license contract with HITACH

We are pleased to announce that GAIO has recently concluded a large-scale usage-based license contract with HITACH in April, 2012 for GAIO's unit test tool, CoverageMaster winAMS. More Info

2012.6.19-21 : Embedded China 2012 in Shanghai

GAIO attended the exhibition show 'Embedded China 2012' held at Shanghai World Expo Exhibition and Convention Center. We displayed the embedded software unit testing tool 'CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262. More Info

2012.2.28 : Embedded World 2012 in Nuremberg, Germany

GAIO attended the exhibition show 'Embedded World 2012' held at Fachmesse in Nuremberg, Germany. We displayed the embedded software unit testing tool 'CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262. More Info

2011.6.1 : Private Seminar : GAIO MBD/MDD Solution Seminar

A private seminar was held at the Tokyo International Forum on the topic of MBD/MDD solution and GAIO's new business named 'MCD' (Model Centered Development). See Photos(Japanese)

2011.5.11-13 : Embedded Systems Expo - ESEC2011

GAIO attended the exhibition show 'Embedded Systems Expo 2011' held at Tokyo Big Sight. See Photos(Japanese)

2010.12.1-3 : Embedded Technology 2009 - ET2010

GAIO will attend the exhibition show 'Embedded Technology 2010' held at Pacifico Yokohama. More Info. (Japanese)

2010.5.12-14 : Embedded Systems Expo - ESEC2010

GAIO attended the exhibition show 'Embedded Systems Expo 2010' held at Tokyo Big Sight. See Photos(Japanese)

2009.11.18-19 : Embedded Technology 2009 - ET2009

GAIO will attend the exhibition show 'Embedded Technology 2009' held at Pacifico Yokohama. More Info. (Japanese)

2009.5.13-15 : Embedded Systems Expo - ESEC2009

GAIO attended the exhibition show 'Embedded Systems Expo 2009' held at Tokyo Big Sight. See Photos(Japanese)

2008.11.19 : Embedded Technology 2008 - ET2008

GAIO attended the exhibition show 'Embedded Technology 2008' held at Pacifico Yokohama. See Photos(Japanese)

2008.5.14 : Embedded Systems Expo - ESEC2008

This year the GAIO booth featured a demonstration counter, where presentations about our products and services were made to customers on an individual basis. See photos (Japanese)

2008.4.23 : Private Seminar : Third-party Unit Testing Service

A private seminar was held at the Tokyo International Forum on the topic of third-party unit testing, where Dr. Tetsuro Katayama, an authority on software testing, was invited as a lecturer. See Photos(Japanese)

2007.10.16 : GAIO Becomes a Member of AUTOSAR

GAIO has become an associate member of AUTOSAR (AUTomotive Open System ARchitecture), an open and standardized automotive software architecture jointly developed by automobile manufacturers, suppliers and tool developers. AUTOSAR WEB Page

2007.10.16 : GAIO Becomes a Member of AUTOSAR

GAIO has become an associate member of AUTOSAR (AUTomotive Open System ARchitecture), an open and standardized automotive software architecture jointly developed by automobile manufacturers, suppliers and tool developers. AUTOSAR WEB Page

 

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