Welcome to the GAIO TECHNOLOGY Web Site
Global tool Interlink Solution (GIS)
Global tool Interlink Solution (GIS) is GAIO's new comprehensive development and verification solution designed for embedded system developers. Through GIS, GAIO's original tools and services may be linked with other company's tools in order to create custom tool chains to meet the needs of embedded system developers.
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Seminar Service
Automated Target Testing Solution
Virtual Verification Tool
Fault Injection Simulator
Coverage Measurement Unit Testing Tool
Model/Code Back-o-Back Test Tool
WXG Functional Safety Solution
Software Unit Quality Diagnositc
Embedded Software Analysis Service
Functional Safety Solution ISO26262 IEC61508
Flowchart Program Chart Generation
Model Centered Development (MCD) Services
GAIO provides comprehensive MBD (Model Base Development) and MDD (Model Driven Development) solutions based on our embedded development tool and service experience. GAIO offers development services and consultation we call MCD, Model Centered Development services.
Latest News
2012.2.26-28 : Embedded World 2013 in Nuremberg, Germany
GAIO attended the exhibition show 'Embedded World 2013' held at Fachmesse in Nuremberg, Germany. We displayed the embedded software unit testing tool '
CoverageMaster winAMS', the MBD Back-to-Back test tool 'MC-Checker' and the solutions for the automotive functional safety, ISO26262.
More Info
2012.11.14-16 : Embedded Technology 2012 at Pacifico Yokohama, JAPAN
GAIO attended the exhibition show 'Embedded Technology 2012' held at Pacifico Yokohama. We displayed the embedded software unit testing tool 'CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262.
More Info (Japanese)
2012.9.1 : GAIO becomes an authorized dealer of HighTec's TriCore/Power Architecture compilers
GAIO becomes an authorized dealer of HighTec's TriCore/Power Architecture compilers in the Japanese market domain.

Product Information (Japanese) :
TriCore /
Power Architecture
2012.7.5 : GAIO obtained tool certification for automotive functional safety ISO 26262
CoverageMaster winAMS/General and CasePlayer2 have been certified by TUV SUD Germany as tools that meet ISO 26262 standard. GAIO is the first company to obtain the tool certification in the Asia-Pacific region.
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2012.6.29 : GAIO concludes large-scale usage-based license contract with HITACH
We are pleased to announce that GAIO has recently concluded a large-scale usage-based license contract with HITACH in April, 2012 for GAIO's unit test tool, CoverageMaster winAMS.
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2012.6.19-21 : Embedded China 2012 in Shanghai
GAIO attended the exhibition show 'Embedded China 2012' held at Shanghai World Expo Exhibition and Convention Center. We displayed the embedded software unit testing tool '
CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262.
More Info
2012.2.28 : Embedded World 2012 in Nuremberg, Germany
GAIO attended the exhibition show 'Embedded World 2012' held at Fachmesse in Nuremberg, Germany. We displayed the embedded software unit testing tool '
CoverageMaster winAMS' and the solutions for the automotive functional safety, ISO26262.
More Info
2011.6.1 : Private Seminar : GAIO MBD/MDD Solution Seminar
A private seminar was held at the Tokyo International Forum on the topic of MBD/MDD solution and GAIO's new business named 'MCD' (Model Centered Development).
See Photos(Japanese)
2011.5.11-13 : Embedded Systems Expo - ESEC2011
GAIO attended the exhibition show 'Embedded Systems Expo 2011' held at Tokyo Big Sight.
See Photos(Japanese)
2010.12.1-3 : Embedded Technology 2009 - ET2010
GAIO will attend the exhibition show 'Embedded Technology 2010' held at Pacifico Yokohama.
More Info. (Japanese)
2010.5.12-14 : Embedded Systems Expo - ESEC2010
GAIO attended the exhibition show 'Embedded Systems Expo 2010' held at Tokyo Big Sight.
See Photos(Japanese)
2009.11.18-19 : Embedded Technology 2009 - ET2009
GAIO will attend the exhibition show 'Embedded Technology 2009' held at Pacifico Yokohama.
More Info. (Japanese)
2009.5.13-15 : Embedded Systems Expo - ESEC2009
GAIO attended the exhibition show 'Embedded Systems Expo 2009' held at Tokyo Big Sight.
See Photos(Japanese)
2008.11.19 : Embedded Technology 2008 - ET2008
GAIO attended the exhibition show 'Embedded Technology 2008' held at Pacifico Yokohama.
See Photos(Japanese)
2008.5.14 : Embedded Systems Expo - ESEC2008
This year the GAIO booth featured a demonstration counter, where presentations about our products and services were made to customers on an individual basis.
See photos (Japanese)
2008.4.23 : Private Seminar : Third-party Unit Testing Service
A private seminar was held at the Tokyo International Forum on the topic of third-party unit testing, where Dr. Tetsuro Katayama, an authority on software testing, was invited as a lecturer.
See Photos(Japanese)
2007.10.16 : GAIO Becomes a Member of AUTOSAR
GAIO has become an associate member of AUTOSAR (AUTomotive Open System ARchitecture), an open and standardized automotive software architecture jointly developed by automobile manufacturers, suppliers and tool developers.
AUTOSAR WEB Page
2007.10.16 : GAIO Becomes a Member of AUTOSAR
GAIO has become an associate member of AUTOSAR (AUTomotive Open System ARchitecture), an open and standardized automotive software architecture jointly developed by automobile manufacturers, suppliers and tool developers.
AUTOSAR WEB Page